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Home > All Collections > TEST PROBES & FINGERS > IP2X Jointed Test Finger Probe B With 50N Thrust For IEC61032 Standard
  • IP2X Jointed Test Finger Probe B With 50N Thrust For IEC61032 Standard
  • IP2X Jointed Test Finger Probe B With 50N Thrust For IEC61032 Standard

IP2X Jointed Test Finger Probe B With 50N Thrust For IEC61032 Standard

No.HNT-PBT

Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

5. Thrust: 10-50N

6, According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032

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  • IP2X Jointed Test Finger Probe B With 50N Thrust For IEC61032 Standard

Description

IEC61032 IEC60529 IP2X Jointed Finger Probe B With Banana Jack In Handle

With 50N Thrust Dynamometer



Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

5. Thrust: 10-50N

6, According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032

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